Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) enabled analysis of inter-polymer phases formation in poly (diaminonaphthalene) doped conducting poly (vinyl alcohol) films

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) enabled analysis of inter-polymer phases formation in poly (diaminonaphthalene) doped conducting poly (vinyl alcohol) films

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 110, 10 February 2017, Pages 211-217

Anil Kumar Bajpai, Rinkesh Bhatt,