A study on the crystallization behavior of poly(β-hydroxybutyrate) thin films on Si wafers

The exact molecular chain orientation of poly(β-hydroxybutyrate) (PHB) in ultrathin films was successfully probed using surface-sensitive, grazing incidence X-ray diffraction techniques. The crystal orientation of spin-coated PHB films was very sensitive to free surface and thermal annealing. In pristine films, the free surface easily exerted its influence on PHB crystallization and caused lamellar orientation with the b-axis perpendicular to the film surface. The effect of the buried interface increased with temperature. With the increase in thermal annealing temperature, the lamellar orientation changed from the b-axis being perpendicular to the film surface to the c-axis becoming perpendicular to the film surface. As film thickness increased, the temperature, at which the lamellae with the b-axes oriented normal to the film surface disappeared, increased. The thickness and temperature dependence of the crystallization behavior of PHB in an ultrathin film could be attributed to the competition between the effects of the free surface and the buried interface.