Composition fluctuations before dewetting in polystyrene/poly(vinyl methyl ether) blend thin films

We report structural development in blend thin films of deuterated polystyrene (dPS) and poly(vinyl methyl ether) (PVME) below ∼200 nm in two phase region during the incubation period before dewetting using neutron reflectivity (NR) and atomic force microscopy (AFM). As was predicted by the former optical microscope (OM) and small-angle light scattering (LS) measurements on blend thin films of protonated PS and PVME [Ogawa H, Kanaya T, Nishida K, Matsuba G. Polymer 2008;40:254-62.], the NR results clearly showed that the tri-layer structure consisting of the surface PVME layer, the middle blend layer and the bottom PVME layer was formed in the one phase region. After the temperature jump into the two phase region, it was found that the phase separation of the middle blend layer proceeded in the depth direction during the incubation period before dewetting, suggesting that the dewetting was induced by the composition fluctuations during the incubation period.