Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene-poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry

Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene-poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 50, Issue 10, 8 May 2009, Pages 2273-2280

Helene C. Maire, Shaida Ibrahim, Yongxin Li, Takashi Ito,