کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5187718 1381136 2005 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Plastic deformation of polyethylene crystals as a function of crystal thickness and compression rate
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آلی
پیش نمایش صفحه اول مقاله
Plastic deformation of polyethylene crystals as a function of crystal thickness and compression rate
چکیده انگلیسی
Plastic deformation of polyethylene (PE) samples with crystals of various thickness was studied during uniaxial compression with initial compressive strain rates of 5.5×10−5, 1.1×10−3 and 5.5×10−3 s−1. Samples with a broad range of crystals thickness, from usual 20 up to 170 nm, were obtained by crystallization under high pressure. The samples underwent recoverable compression below the compression ratio of 1.05-1.07. Following yield, plastic flow sets in above a compression ratio of 1.12. At a compression rate of 5.5×10−5 s−1 the yield stress increases with the increase of crystal thickness up to 40 nm. For crystals thicker than 40 nm the yield stress levels off and remains constant. This experimental dependence was compared with the model developed on the basis of classical crystal plasticity and the monolithic nucleation of screw dislocations from polymer crystals. In that model contrary to the experimental evidence, the yield stress does not saturate with increase of crystal thickness. The activation volumes determined from strain rate jump experiments and from stress relaxation for crystals thicker than 40 nm are nearly constant at a level of 8.1 nm3. This activation length agrees very well with 40 nm for crystal thickness above which the yield stress levels off. It is proposed, as shown in a companion communication, that for PE crystals thicker than 40 nm two other modes of dislocation emission in the form of half loops of edge and screw dislocations begin to govern the strain rate, which no longer depend on lamella thickness.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 46, Issue 21, 7 October 2005, Pages 8926-8936
نویسندگان
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