کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5188982 1381174 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Vapor sorption in thin supported polymer films studied by white light interferometry
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آلی
پیش نمایش صفحه اول مقاله
Vapor sorption in thin supported polymer films studied by white light interferometry
چکیده انگلیسی
In the present study, we apply a white light interferometric methodology to study sorption of moisture and methanol vapor in thin films of poly(2-hydroxyethyl methacrylate) [PHEMA] and poly(methyl methacrylate) [PMMA], supported on oxidized silicon wafers. The measured equilibrium thickness expansion of each film, exposed to different activities of the vapor penetrant, is used to determine the sorption isotherm of the system. Results for relatively thick films (100 nm < Lo < 600 nm) are compared with corresponding literature data for bulk, free-standing films, obtained by direct gravimetric methods. Furthermore, PMMA films of thicknesses lower than 100 nm were employed in order to study the effect of the dry film's thickness, and of substrate, on fractional swelling.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 47, Issue 17, 9 August 2006, Pages 6117-6122
نویسندگان
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