Identification and localization of organic coating degradation onset by impedance imaging

The aim of this work was to demonstrate the potential of a localized impedance measurement technique to identify and spatially localize the onset spots of polymeric coating degradation. The technique, which has not yet been applied in the field of organic coatings, utilizes atomic force microscopy (AFM) in contact mode. During the scan a single-frequency voltage perturbation signal is applied between the AFM tip and the coated metal substrate. A current response signal is registered. As a result an impedance map of the scanned region is created. The method was applied to investigation of acrylic coating degradation during exposure to UV radiation. Localized topography and impedance images revealed formation of micro-cracks in the coating layer, which gradually converted into through-the-coating defects with an increase in the irradiation time. Thus the method allowed early identification and localization of the sites of degradation onset, which was not possible using classical impedance measurement.