کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5207113 | 1382336 | 2011 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Dielectric response measurements during electrical treeing in sub-picofarad samples
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آلی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
A technique called Arbitrary Waveform Impedance Spectroscopy (AWIS) developed for measuring dielectric properties in insulating materials has been used to study capacitance and dielectric loss changes during electrical tree growth in LDPE samples. The sample capacitance is small, in the range of 0.1-0.15Â pF, placing high demands on the measurement system. Simulations in FEM-software show that the measured capacitance is in agreement with simulated values and can be used to estimate tree growth rate. It also seems to be possible to differentiate between different regions of tree growth by analyzing changes in capacitance and loss of the studied samples.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer Testing - Volume 30, Issue 1, February 2011, Pages 43-49
Journal: Polymer Testing - Volume 30, Issue 1, February 2011, Pages 43-49
نویسندگان
Björn Sonerud, Tord Bengtsson, Jörgen Blennow, Stanislaw M. Gubanski, Susanne Nilsson,