Ultraviolet photoelectron spectroscopy of nano In clusters Schottky barriers on sputtered InP

► Ultraviolet photoelectron spectroscopy is used to study effect of nano In clusters on photoelectron spectra of sputtered InP wafers. ► Plasmon peak is observed in the presence of nano In clusters. However, filled energy levels at the Fermi level are not observed. ► Results will be useful in study of epitaxial layers deposited on InP.