کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5363223 | 1388298 | 2008 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A transmission electron microscopy study on the crystal structure and atomic arrangement of Al-Nd thin films deposited on glass substrates
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
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چکیده انگلیسی
The crystal structure and atomic arrangement of Al-2 at.% Nd thin films were investigated by a transmission electron microscopy (TEM) study. As a result, we have revealed that Nd atoms exist in Al matrix as solid solutions in the state of as-deposited and annealed at low temperature, while the intermetallic compounds with the composition of Al4Nd are precipitated as the annealing temperature increased above 300 °C. The precipitated Al4Nd has a tetragonal structure with nine cyclic layers, and the atomic arrangement was identified by the fast Fourier transform (FFT) and Fourier filtered images as well as the experimental high-resolution transmission electron microscopy (HRTEM) images. Consequently, Nd atoms, forms of solid solutions or precipitates, effectively suppress the grain growth of Al.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 255, Issue 5, Part 1, 30 December 2008, Pages 2104-2108
Journal: Applied Surface Science - Volume 255, Issue 5, Part 1, 30 December 2008, Pages 2104-2108
نویسندگان
Yu Jin Park, Hyuk Nyun Kim, Hyun Ho Shin,