کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5367969 1388378 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Role of cleaning methods on bond quality of Ti coated glass/imidex system
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Role of cleaning methods on bond quality of Ti coated glass/imidex system
چکیده انگلیسی

Thin film materials are widely used in the fabrication of semiconductor microelectronic devices. In thin film deposition, cleanliness of substrate surface have become critically important as over 50% of yield losses in integrated circuit fabrication are caused by microcontamination [1]. There are many wafer cleaning techniques. The most successful approach for silicon wafer cleaning technique is RCA clean [2]. But for glass substrate it is still not known which procedure of cleaning is the best. This paper provides an understanding of the right way of glass wafer cleaning method, with a focus towards identifying good bond strength. Two wafer cleaning techniques have been used for cleaning glass substrates in the context of laser micro-joining of dissimilar substrates. First cleaning procedure involves two steps, first cleaning in acetone solution and then in DI water solution. After each step dried with N2. Second cleaning procedure involves four steps, first cleaning with 1% Alconox solution, second in DI water, third in acetone solution and finally in a methanol solution and dried with N2 after each step. Deposition of Ti thin film on top of these two types of substrate using DC magnetron sputtering method also showed better adhesion of Ti film on glass for the second type of cleaning method. Scanning electron microscopy (SEM) analyses of the lap shear tested failed surfaces for these two kinds of samples revealed strong bond for samples prepared by second cleaning method compared to first cleaning method. Characterization of these two sets of samples using X-ray photoelectron spectroscopy (XPS) has shown excellent contamination removal for the second cleaning method. This modification is believed to be due to reduction of carbon contamination.

Research highlights▶ Two cleaning methods are used for cleaning glass wafer: (i) regular cleaning and (ii) special cleaning. ▶ We observed significant contamination removal for samples prepared by special cleaning method. ▶ Good bond strengths are also obtained for the samples prepared by special cleaning method compared to regular cleaning method.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 257, Issue 10, 1 March 2011, Pages 4749-4753
نویسندگان
, , , , ,