کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5369691 | 1388447 | 2007 | 5 صفحه PDF | دانلود رایگان |

The manganite La0.67Sr0.33MnO3 (LSMO) layers are deposited on single crystal MgO(0Â 0Â 1) substrates using a magnetron dc sputtering. The crystalline perfection of the layers, both the as-prepared and the annealed, are characterized by X-ray diffraction technique, rocking curve measurements, Rutherford backscattering spectroscopy (RBS) and transmission electron microscopy (TEM). TEM analyses give evidence of the epitaxial growth of the annealed LSMO with a nanocrystalline surface layer. The temperature dependence of resistance in the 77-340Â K range is measured by a standard four-probe technique. While the as-prepared film does not show any transition from paramagnetic to ferromagnetic state, the film annealed in oxygen shows steep R(T) dependence with a peak at 330Â K and maximal slope (dR/dT) at 290Â K where the maximal sensitivity is 3%Â Kâ1.
Journal: Applied Surface Science - Volume 253, Issue 18, 15 July 2007, Pages 7599-7603