Keywords: رادرفورد پشت سرهم; Sputtering; Damage; Ellipsometry; Rutherford backscattering; Electron microscopy;
مقالات ISI رادرفورد پشت سرهم (ترجمه نشده)
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Keywords: رادرفورد پشت سرهم; 2D; Two-Dimensional; 2DEG; Two-Dimensional Electron Gas; 2DPS; Two-Dimensionally-Periodic Slab; 3D; Three-Dimensional; AES; Auger Electron Spectroscopy; AFM; Atomic Force Microscopy; ARUPS; Angle-Resolved Ultraviolet Photoemission Spectroscopy; B3LYP; Bec
Keywords: رادرفورد پشت سرهم; diffusion measurements; crystal surfaces; depth profiling; Rutherford backscattering; nuclear reaction analysis; ion microprobe;
Keywords: رادرفورد پشت سرهم; Femtosecond laser; Microstructure; Rutherford backscattering; X-ray diffraction; TOF-SIMS;
Keywords: رادرفورد پشت سرهم; AES; Auger electron spectroscopy; BGO; Bismuth germanium oxide (Bi4Ge3O12); CRB; cosmic radiation background; CVD; chemical vapor deposition; ERD(A); elastic recoil detection (analysis); DFT; density functional theory; FET; field effect transistor; FGA; f
Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN
Keywords: رادرفورد پشت سرهم; Neutron induced alpha emission; Thermal evaporation; Rutherford backscattering;
Stoichiometry control in Cu2ZnSnS4 thin films grown by pulsed laser deposition
Keywords: رادرفورد پشت سرهم; Cu2ZnSnS4 absorber; Pulsed laser deposition; Raman spectroscopy; Rutherford backscattering;
Suppression of the green emission, texturing, solute-atom diffusion and increased electron-phonon coupling induced by Ni in sol-gel ZnNiO thin films
Keywords: رادرفورد پشت سرهم; Sol-gel synthesis; Zn1âxNixO; Rutherford backscattering; Depth-profiling X-ray photoelectron spectroscopy; Electron-phonon coupling; Fröhlich interaction;
Growth behavior of co-electrodeposited CZTS precursor thin films from acidic baths containing tartaric acid
Keywords: رادرفورد پشت سرهم; Cu2ZnSnS4; Co-electrodeposition; Cyclic voltammetry; Rutherford backscattering;
The effects on γ-LiAlO2 induced by nuclear energy losses during Ga ions implantation
Keywords: رادرفورد پشت سرهم; Ion implantation; γ-LiAlO2; Rutherford backscattering;
Effect of concentration and irradiation on the optical and structural properties of ZnO thin films deposited by spray pyrolysis techniques
Keywords: رادرفورد پشت سرهم; Thin film; Transmittance; Rutherford Backscattering; Bandgap; Zinc acetate;
Atomic layer deposited ZnO films implanted with Yb: The influence of Yb location on optical and electrical properties
Keywords: رادرفورد پشت سرهم; 61.72.Vv; 61.85. + p; 78.55.Et; 78.66.Hf; 81.15.Gh; Zinc oxide; Ion implantation; Rare-earth; Ytterbium; Rutherford backscattering; Photoluminescence;
Hierarchical film formation and structural characterization using MeV-ion beams
Keywords: رادرفورد پشت سرهم; TiAlN/MoN multilayered coatings; C-implanted ZnOS epilayers; Rutherford backscattering; Non-Rutherford backscattering;
Computer simulation of RBS spectra from samples with surface roughness
Keywords: رادرفورد پشت سرهم; Computer simulation; Rutherford backscattering; Surface roughness
Improvement in the electronic quality of pulsed laser deposited CuIn0.7Ga0.3Se2 thin films via post-deposition elemental sulfur annealing process
Keywords: رادرفورد پشت سرهم; Cu(In,Ga)(Se,S)2 absorber; Pulsed laser deposition; Elemental sulfur annealing; Hall effect; Raman spectroscopy; Rutherford backscattering;
Structural and gas sensing properties of ex-situ oxidized Sn grown by thermal evaporation
Keywords: رادرفورد پشت سرهم; SnO2 thin films; GIXRD; Rutherford backscattering; Raman spectroscopy; Methane gas sensor;
Study of the effect of passivation layers on capacitance of AlGaN/GaN heterostructures
Keywords: رادرفورد پشت سرهم; AlGaN/GaN heterostructures; Capacity-voltage characteristic; Frequency measurement; Band diagram; 2D electron gas; Dislocation; Rutherford backscattering;
Experimental and modeling study on increasing accuracy of strain measurement by ion beam analysis in SiGe strained layer thin films
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Ion channeling; Strained layer thin films; Molecular beam epitaxy;
Multilayer Si/Ge thin films with quantum confinement effects for photovoltaic applications
Keywords: رادرفورد پشت سرهم; Multi-layer Si/Ge thin films; Raman spectroscopy; Rutherford backscattering; Fourier transform infrared spectroscopy;
Improved physics in SIMNRA 7
Keywords: رادرفورد پشت سرهم; Computer simulation; Ion beam analysis; SIMNRA; Rutherford backscattering; Nuclear reaction analysis;
Enhanced ZnTe infiltration in porous silicon by Isothermal Close Space Sublimation
Keywords: رادرفورد پشت سرهم; Porous silicon; ZnTe; Rutherford backscattering; Optical reflectance
Effect of In implantation and annealing on the lattice disorder and nano-mechanical properties of GaN
Keywords: رادرفورد پشت سرهم; Implantation; Annealing; Gallium nitride; Nanomechanical properties; Raman spectroscopy; Rutherford backscattering;
Three hundred micron squared all-solid-state Li ion secondary battery fabricated by Si very large scale integration technology
Keywords: رادرفورد پشت سرهم; Li free anode; All solid state battery; Li ion battery; Si VLSI technology; Polymer electrolyte; Rutherford backscattering
Determination of dopant concentration in co-deposited organic thin films by using RBS and X-ray fluorescence combined techniques
Keywords: رادرفورد پشت سرهم; PHOLEDs; Organic thin film; Thermal co-deposition; Spiro2-CBP; X-ray fluorescence; Rutherford backscattering;
Measurement and evaluation of the 13C(p,p)13C cross section in the energy range 0.8-2.4Â MeV
Keywords: رادرفورد پشت سرهم; Elastic backscattering; Rutherford backscattering; Cross section; 13C;
Analytical solution for depth scale calculations in Rutherford backscattering spectrometry
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Depth scale
Charge-state distributions of energetic 4He ions backscattered from Kr gas target
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Ion–atom collisions; Charge-states
“Total IBA” – Where are we?
Keywords: رادرفورد پشت سرهم; Ion beam analysis; Rutherford backscattering; Particle induced X-ray analysis; Thin films; Elemental depth profiling; Mapping; Trace elements; High sensitivity; Accurate analysis; Uncertainty budget; Blind samples; Certified reference materials; Forensics
Accumulation, translocation and impact of TiO2 nanoparticles in wheat (Triticum aestivum spp.): Influence of diameter and crystal phase
Keywords: رادرفورد پشت سرهم; NP; nanoparticle; SR-μXRF; synchrotron-radiation micro-X-ray fluorescence; μPIXE; micro-particle-induced X-ray emission; RBS; Rutherford backscattering; STIM; scanning transmission ion microscopy; TEM; transmission electron microscopy; SEM; scanning ele
Structure and composition of sputter-deposited nickel-tungsten oxide films
Keywords: رادرفورد پشت سرهم; Tungsten oxide; Nickel oxide; X-ray photoelectron spectroscopy; Rutherford backscattering; X-ray diffraction; Raman spectroscopy
Raman scattering and Rutherford backscattering studies on InN films grown by plasma-assisted molecular beam epitaxy
Keywords: رادرفورد پشت سرهم; InN; Plasma-assisted molecular beam epitaxy; Rutherford backscattering; Raman scattering; Photoluminescence
Studies on distribution of element contents in transient layer at interface between boron-doped diamond film electrode and tantalum substrate
Keywords: رادرفورد پشت سرهم; 68.35.Fx; 68.55.Ln; 61.82.Bg; Microstructure of continuous transient layer; Boron-doped diamond film; Rutherford backscattering;
Strain in GaAsSb quantum well studied by X-ray diffraction and Rutherford backscattering/channeling
Keywords: رادرفورد پشت سرهم; GaAsSb quantum well; Elastic strain; X-ray diffraction; Rutherford backscattering
Ion beam analysis of sputtered AlN films
Keywords: رادرفورد پشت سرهم; AlN; Reactive sputtering; Rutherford backscattering; AFM; Ellipsometry
Coincident Rutherford Backscattering Spectrometry: A novel technique for measuring charge state distributions in violent ion–atom collisions
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Coincidence; Charge state; Correlation
Ion beam analysis of a structural phase transition in porous TiO2/V2O5 ceramics with rough surfaces
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Rough surfaces; Porous ceramic material; Rutile solid solution; Phase transition
Ion-beam sputtering and nanostructures of noble metals
Keywords: رادرفورد پشت سرهم; Sputtering; Nanoclusters; Optical absorption; Rutherford backscattering; Electron microscopy;
Elastic scattering of 7Li + 27Al at several angles in the 7-11 MeV energy range
Keywords: رادرفورد پشت سرهم; Elastic scattering; Rutherford backscattering; Optical Model; 7Li + 27Al system;
Beam dispersion of ions penetrating through an amorphous compound binary layer
Keywords: رادرفورد پشت سرهم; Channeling; Dechanneling; Rutherford backscattering;
Monte Carlo simulations of ion channeling in crystals containing extended defects
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Ion channeling; Monte Carlo simulations; GaN epitaxial layers; Ion bombardment; Extended defects
Study of Cu+, Ag+ and Au+ ion implantation into silicate glasses
Keywords: رادرفورد پشت سرهم; Ion implantation; Silicate glasses; Metal nanoparticles; Rutherford backscattering
The mutual influence of krypton implantation and pre-existing stress states in polycrystalline alpha titanium
Keywords: رادرفورد پشت سرهم; Synchrotron radiation; Stress-assisted diffusion; Stress relaxation; Drift; Rutherford backscattering;
A Pearson VII distribution function for fast calculation of dechanneling and angular dispersion of beams
Keywords: رادرفورد پشت سرهم; 61.05.Np; 61.85.+p; 61.80.Jh; Channeling; Dechanneling; Rutherford backscattering;
MeV Si ions bombardment effects on the thermoelectric properties of Co0.1SbxGey thin films
Keywords: رادرفورد پشت سرهم; 81.15.Jj; 72.20.Pa; 07.81.+a; Ion beam deposition; Thermoelectric properties; Rutherford backscattering; Figure of merit;
Optical investigations of germanium nanoclusters – Rich SiO2 layers produced by ion beam synthesis
Keywords: رادرفورد پشت سرهم; 61.72.uf; 68.55.Ln; 78.67.−n; 82.80.YcGe nanostructures; Optical constants; Ion implantation; Rutherford backscattering; Spectroscopic ellipsometry
Thickness and MeV Si ions bombardment effects on the thermoelectric properties of Ce3Sb10 thin films
Keywords: رادرفورد پشت سرهم; 81.15.Jj; 72.20.Pa; 07.81.+a; IBAD; Thermoelectric properties; Rutherford backscattering; Figure of merit;
Bonding rearrangement in amorphous silicon nitrides deposited by hot-wire chemical vapor deposition upon thermal annealing
Keywords: رادرفورد پشت سرهم; 68.60.−p; 68.55.Jk; 78.30.−j; 78.55.QrSilicon; Solar cells; Photovoltaics; Chemical vapor deposition; Rutherford backscattering; FT-IR measurements
Ion beam induced mixing of co-sputtered Au-Ni films analyzed by Rutherford backscattering spectrometry
Keywords: رادرفورد پشت سرهم; Rutherford backscattering; Depth profiling; Au-Ni co-sputtered film; Ion irradiation; 82.80.Yc; 68.55.Ln; 61.72.Ss; 81.70.Jb;
Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis
Keywords: رادرفورد پشت سرهم; 82.80.Yc; 24.40.Cm; 02.50.TtElastic backscattering; Rutherford backscattering; Cross-sections; NDF; Bayesian inference
Mechanical and microstructural changes of Ti and Ti–6Al–4V alloy induced by the absorption and desorption of hydrogen
Keywords: رادرفورد پشت سرهم; Metal hydride; Hydrogen absorption materials; Rutherford backscattering; X-ray diffraction