کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
539836 871274 2013 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Post-silicon power mapping techniques for integrated circuits
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Post-silicon power mapping techniques for integrated circuits
چکیده انگلیسی

We propose a new methodology for post-silicon power validation using the captured thermal infrared emissions from the back-side of operational integrated circuits. We first identify the challenges associated with thermal to power inversion, and then we address these challenges by devising a quadratic optimization formulation that incorporates Tikhonov filtering techniques to find the most accurate power maps. To validate our methodology, a programmable circuit of micro-heaters is implemented to create a number of reference power maps. The thermal emissions from the circuit are captured using an infrared camera and then inverted to yield highly accurate post-silicon power maps.


► We discuss of the challenges associated with post-silicon power mapping from thermal emissions.
► We propose techniques from regularization theory to reduce noise and constrain the solution space.
► We implement a test chip to evaluate and validate post-silicon mapping algorithms.
► We description of a working system to translate thermal emissions into spatial power maps.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Integration, the VLSI Journal - Volume 46, Issue 1, January 2013, Pages 69–79
نویسندگان
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