کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
542089 871521 2011 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Test data compression using interval broadcast scan for embedded cores
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Test data compression using interval broadcast scan for embedded cores
چکیده انگلیسی

The paper proposes a new test data compression scheme for testing embedded cores with multiple scan chains. The new compression scheme allows broadcasting identical test data to several scan chains whenever the cells in the same depth are compatible for the current application test pattern. Thus, it efficiently utilizes the compatibility of the scan cells among the scan chain segments, increases test data run in broadcast mode and reduces test data volume and test application time effectively. It does not need complex compressing algorithm and costly hardware. Experimental results demonstrate the efficiency and versatility of the proposed method.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 42, Issue 11, November 2011, Pages 1313–1319
نویسندگان
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