کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5425588 1395861 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Strain state in bcc Fe films grown on Si(1 1 1)
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Strain state in bcc Fe films grown on Si(1 1 1)
چکیده انگلیسی

The strain state of Fe films grown on Si(1 1 1) has been investigated by X-ray diffraction (XRD) in the thickness range between 11 and 304 monolayers. Fe grows tetragonally distorted with the orientation relationship Fe(1 1 1) 〈12¯1〉 // Si(1 1 1) 〈1¯21¯〉. At low coverage, the films grow pseudomorphic. Above 15 monolayers the films are characterized by the coexistence of a pseudomorphic phase with another one which relaxes with the Fe thickness. This relaxation proceeds rapidly in the earlier stages then slowly with the film thickness. The XRD characterization allows one to obtain quantitative information on the in-plane and out-of-plane strains.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 600, Issue 15, 1 August 2006, Pages 3003-3007
نویسندگان
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