کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
543172 | 871636 | 2015 | 6 صفحه PDF | دانلود رایگان |
This paper presents wide-range complementary to absolute temperature (CTAT) and proportional to absolute temperature (PTAT) sensors with second-order calibration for on-chip thermal monitoring. Particularly, a current mirror and an n-well resistor are used in these sensors to eliminate the second-order term of the temperature coefficient to linearize the transfer function between the output voltage and the temperature. The proposed CTAT and PTAT sensors are implemented on silicon using a typical 0.18 μm CMOS process. The core area of the CTAT and PTAT sensors is 0.0125 mm2 and 0.0074 mm2, respectively. In the range from −55°C to 155°C, the worst deviation of the CTAT and PTAT temperature sensors is measured to be −3.75°Cto+3.34°C and −3.73°Cto+3.85°C, respectively. The maximum non-linearity reduction of the CTAT and PTAT sensors is 59.84% and 87.48%, respectively, by the proposed second-order calibration. Notably, the overhead area of the CTAT and PTAT sensors is only 0.64% and 1.08%, respectively.
Journal: Microelectronics Journal - Volume 46, Issue 9, September 2015, Pages 819–824