Current mapping of low-energy (120Â eV) helium and hydrogen irradiated tungsten by conductive atomic force microscopy

Both conductive atomic force microscopy (CAFM) and transmission electron microscopy have been used to characterize the defects or He bubbles in low-energy (120 eV) H and He irradiated tungsten (W). By a comparative study, we find that the current mapping from CAFM is very sensitive in the detection of nanometer-sized defects in low-energy H and He irradiated W. Our calculation confirms that the resistance change in H and He irradiated W is strongly affected by the distance between atomic force microscopy tip and defects/He bubbles. CAFM can accurately detect defects/He bubbles in the W surface layer, however, it is infeasible to measure them in the deep layer (>20 nm), especially due to the existence of defects in the surface layer.