کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5455361 | 1514638 | 2017 | 26 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Microstructure evolution characteristics of Inconel 625 alloy from selective laser melting to heat treatment
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Superalloy Inconel 625 has been widely used in selective laser melting (SLM). Since SLM-induced microstructure with columnar grains, strong texture, porosity, and undesired properties, heat treatment is often used to tune the microstructure and mechanical properties. However, the microstructure evolution of IN 625 from SLM to heat treatment is poorly understood. In this study, IN 625 samples were SLMed and then heat treated at elevated temperatures. Microstructure evolution characteristics of the processed IN 625 alloy have been characterized using optical metallography, scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), transmission electron microscopy (TEM), X-ray diffraction, and micro indentation. Fine dendrite microstructures with strong texture parallel to layer build-up direction was observed in the as-SLM samples due to rapid cooling and epitaxial growth. High dislocation density and high microhardness were found in the γ matrix which also contains high Z-contrast precipitates. After annealing at high temperatures, random grain growth accompanied by dislocation annihilation and twinning occurs. The decrease in lattice parameter and the prevalence of large grain boundary misorientation in the γ matrix suggests that SLM-induced residual stress be significantly reduced. In addition, the uncertainty of mechanical properties due to the process variations was quantified.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volume 705, 29 September 2017, Pages 20-31
Journal: Materials Science and Engineering: A - Volume 705, 29 September 2017, Pages 20-31
نویسندگان
C. Li, R. White, X.Y. Fang, M. Weaver, Y.B. Guo,