کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5458661 | 1516173 | 2017 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Optical and electrical properties of SiGe/Si solar cell heterostructures: Ellipsometric study
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
SiGe thin films with different Ge fraction were obtained by Molecular Beam Epitaxy (MBE) on silicon (001) substrates. The SiGe thin films properties are obtained using Spectroscopic Ellipsometry (SE) in the frame of the New Amorphous model. This model demonstrates that depending on the Ge fraction high absorption coefficients of order 106 cmâ1 were obtained. The solar cell performance of SiGe/Si heterostructures was measured using a JASCO YQ-250BX system with light source of AM 1.5 solar simulator. The experimental results obtained (y = 0.15, Wa-Si: H = 2 nm) yielded to an improvement of about 1.3 mA cmâ2 for the short-circuit current density, and about 2.2% for the cell efficiency compared to the conventional cell i.e. without a-Si:H thin layer (FSF).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 721, 15 October 2017, Pages 779-783
Journal: Journal of Alloys and Compounds - Volume 721, 15 October 2017, Pages 779-783
نویسندگان
Emna Kadri, Olfa Messaoudi, Monem Krichen, Khaled Dhahri, Mohammed Rasheed, Essebti Dhahri, Abdelaziz Zouari, Kamel Khirouni, Régis Barillé,