Photocarrier dynamic measurement of rutile TiO2 films prepared by RF magnetron reactive sputtering

In this work, rutile titanium dioxide (TiO2) films were prepared on quartz and SiO2/Si substrates utilizing RF magnetron reactive sputtering technology. Crystal structure, surface morphology and optical property of these films were characterized to verify the obtainment of well crystalline rutile TiO2 films. The dynamics of photocarriers were studied by using temporally resolved transient absorption measurements. The differential reflectivity as a function of pump fluence was investigated. We also directly obtained a carrier lifetime of about 286 ps. The absorption cross-section and the absorption coefficient of free carrier at 800 nm were 1.87 × 10−17 cm2 and 32.9 cm−1, respectively.