X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions

X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 722, 25 October 2017, Pages 683-689

A. Ievtushenko, O. Khyzhun, I. Shtepliuk, O. Bykov, R. Jakieła, S. Tkach, E. Kuzmenko, V. Baturin, О. Karpenko, O. Olifan, G. Lashkarev,