کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5466665 1518298 2017 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?
چکیده انگلیسی
In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired using annular dark field (ADF) scanning transmission electron microscopy (STEM). Therefore, we derive an expression for the statistical precision with which the 3D atomic position coordinates can be estimated in a quantitative analysis. Evaluating this statistical precision as a function of the microscope settings also allows us to derive the optimal experimental design. In this manner, the optimal angular tilt range, required electron dose, optimal detector angles, and number of projection images can be determined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 181, October 2017, Pages 134-143
نویسندگان
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