Structural and mechanical properties of Ar-ion irradiated YSZ single-crystals grown in different crystallographic orientations

An effect of Ar-ion irradiation on nanomechanical and structural properties of YSZ single crystals at room temperature was investigated. In order to simulate the radiation damage, the Ar-ions with 160 keV energy were implanted into the YSZ single crystals grown in (1 0 0), (1 1 0) and (1 1 1) crystallographic directions with the fluences ranging from 1 × 1014 to 1 × 1016 ion/cm−2. Nanomechanical properties were measured by means of nanoindentation technique. The measurements were performed under 1, 2 and 3 mN loads which corresponded from ∼20 up to ∼50% of the total thickness of modified layer. Structural properties of the implanted layer were studied by Grazing Incidence X-ray Diffraction (GIXRD) and Raman Spectroscopy techniques. The obtained results revealed that mechanical (hardness and Young modulus) and structural properties (recorded peak shift's) change with Ar-ion fluence. Recorded material hardening and peak shifts were associated with the local increase of residual stress and creation of radiation defects. Presented study suggest that mechanical changes induced by ion irradiation can be correlated with structural response of the specimen (even in the case of very thin layers).