کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547990 872079 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Shielding region effects on a trench gate IGBT
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Shielding region effects on a trench gate IGBT
چکیده انگلیسی

In this paper we introduced the shielding region concept in order to relieve the electric field concentrated on the trench bottom corner. The shielded trench gate insulated gate bipolar transistor (IGBT) is a trench gate IGBT with a P+shielding region located in the bottom of a trench gate. By simulation results, we verified that a shielding region reduced the electric fields not only in the gate oxide but also in the P-base region. Compared with conventional trench gate IGBT, about 33% increment of forward breakdown voltages are achieved, but little forward voltage drop, which causes on-state loss to be increased by about 0.06 V in the shielded trench gate IGBT.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 39, Issue 1, January 2008, Pages 57–62
نویسندگان
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