Improved accuracy of Seebeck coefficient measurement for inhomogeneous thermoelectric film deposited on a substrate

An inverse determination method is proposed for obtaining the Seebeck coefficients of inhomogeneous film deposited on a substrate in a thermoelectric sample due to the spatial resolution limitations of the probe and the effect of the substrate. The two-dimensional finite element method is used to simulate the local Seebeck coefficient measurements and the graphs of various Seebeck coefficients of inhomogeneities versus their corresponding measured values are obtained via simulations. The results indicate that the Seebeck coefficients of the inhomogeneous thermoelectric film can be inversely determined by applying the interpolation method to the graphs. The data profiles in the graphs can be expressed as linear equations which can be applied to DSPs to increase the accuracy and efficiency of the measurements. The improved signal profiles constructed from the inversely determined Seebeck coefficients coincide with the original signal profiles.

► The 2D FEM was used to simulate the local Seebeck coefficient measurements.
► The line scan signals of the measurements were obtained from simulations.
► The spurious measured Seebeck coefficient of inhomogeneity should be corrected.
► The proposed inverse determination method can be used to obtain the Seebeck coefficient of inhomogeneity.