Design of a thermoelectric module test system using a novel test method

In this study, a universal microcontroller test system, which is aimed to determine the dynamic parameters of thermoelectric modules, has been designed and realized using a novel test method. For the purpose of this work, the test system has been designed according to a more simplified form of the present formula set, which has been made to accept minimum variables as input to obtain more precise results. As a result, a test system, which can measure the dynamic parameters of a thermoelectric module universally by measuring only the hot side temperature, module operation voltage, module's current and thermoemf values of the module, has been produced. Also, the realized new test system has been used to measure a standard thermoelectric module (Melcor CP 1.4-127-10L) in order to verify its performance.