An analytical plane-strain solution for surface uplift due to pressurized reservoirs

In this paper, we present an analytical plane strain solution for surface uplift above pressurized reservoirs. The solution is based on a Fourier representation of the reservoir pressure. The plane strain model is developed in two stages: First, an exact solution is derived for the displacement field for the reservoir alone subjected to a periodic overpressure distribution of one wavelength. This one-layer model forms the basis for the analytical plane strain solution for a two-layer model - a pressurized reservoir with an overburden. We give an example where numerically computed uplift is quite accurately estimated by a simple 1D estimate, except for in the near well area. The plane-strain solution is well suited to study conditions for when the simple 1D approximation of the uplift is accurate. A condition for the accuracy of the simple 1D approximation is first derived for just the reservoir expanded by a periodic overpressure distribution of one wavelength, which corresponds to one term in a Fourier series. The 1D estimate is accurate for wavelengths larger than 2π times the reservoir thickness. Then, a condition is derived for when the 1D estimate is accurate for the two-layer model. We show that the wavelength of the overpressure distribution must be larger than 2π times the maximum of the reservoir thickness and the overburden thickness for the 1D approximation to be accurate. We demonstrate how uplift is computed from a Fourier decomposition of the reservoir overpressure. The resulting uplift is analysed in terms of Fourier coefficients, using the knowledge of how a single wavelength behaves. The analytical results for the displacement field and the uplift are tested by comparison with finite element simulations, and the match is excellent.