کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6748501 | 1430176 | 2017 | 31 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A finite element correction method for sub-20â¯nm nanoindentation considering tip bluntness
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی عمران و سازه
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Due to substrate effects and inherent tip bluntness, using current state-of-the-art nanoindentation instrumentation, it is difficult to directly measure mechanical properties of thin films less than 20â¯nm thick. With the aid of Finite Element Analysis (FEA), we obtain the mechanical properties by correlating simulated force-displacement responses with those from nanoindentation experiments. For shallow indentation experiments that is required for very thin films, it is found that an indenter model with a blunt tip is more realistic and leads to accurate characterization of mechanical properties. The proposed blunt tip model is validated with experiments on a standard fused quartz sample, and then applied to measure the nanomechanical properties of a 90â¯nm thick metal alloy layer and a 14â¯nm thick magnetic layer sandwiched between a carbon overcoat and a metal alloy. The magnetic layer properties are found to be 180â¯GPa for the reduced modulus and 2.9â¯GPa for the yield strength.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Solids and Structures - Volume 129, 15 December 2017, Pages 49-60
Journal: International Journal of Solids and Structures - Volume 129, 15 December 2017, Pages 49-60
نویسندگان
Zhang Youfeng, Wang Hongbo, Li Xinwei, Tang Huan, Andreas A. Polycarpou,