Using a new approach to analyze a depth profile of double bond conversion in model formulations

A new approach of analyzing the depth profile of double bond conversion as a function of film depth has been studied. By using a combination of statistical calculation and traditional FTIR, a new approach to analyze the depth profile of conversion “layer by layer” in the characterization of photopolymerization was explored. Utilizing a formula (X1 + X2 + ⋯ + Xn)/n = average conversion, n = 1, 2, 3, ⋯ n is a number of layers (μm), an average conversion of any 5 μm depth could be calculated from the prior 5 μm conversion and the total average conversion. More detailed information of photopolymerization, such as the depth profile of conversion and a difference in conversion between the top 5 μm and the bottom 5 μm in a 25 μm film as a function of film depth, was obtained. This investigation was accomplished using a variation of film depth, non-photo bleaching photo initiator [PhI] as well as the concentration of PhIs in the presence of air and in the absence of air. Results of analyzing double bond conversion between traditional FTIR and the new approach (statistical calculation/FTIR) were compared.