کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6945514 | 1450516 | 2018 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Specification analysis of the deteriorating sensor for required lifetime prognostic performance
ترجمه فارسی عنوان
تجزیه و تحلیل مشخصات سنسور رو به زوال برای عملکرد پیش آگهی در طول عمر مورد نیاز
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کلمات کلیدی
خطای اندازه گیری، آنتروپی نسبی، فرآیند وینر، برآورد طول عمر، قابلیت اطمینان،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
چکیده انگلیسی
Lifetime prognostic based on the degradation data has been widely investigated and adopted for reliability assessment and maintenance policy. However, the measurement error (ME) is usually inevitable, which leads to the bias of lifetime estimation and erroneous evaluation of the safety risk. In this paper, we mainly focus on an inverse issue: how to specify the sensor's performance (i.e., the ME range) for satisfying a given requirement of the lifetime estimation. Under this consideration, we first analyze the probability distribution functions of the lifetime estimation with/without the ME based on Wiener process degradation model. Then a distance measure based on the relative entropy is formulated to evaluate the difference between these two lifetime estimations. Furthermore, the permissible ranges of the time-dependent and time-independent ME are attained under a given allowable bias of lifetime estimation according to the proposed distance measure. In addition, the influence of the ME on maintenance policy is discussed. Finally, numerical examples and a case study are provided to illustrate.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 85, June 2018, Pages 71-83
Journal: Microelectronics Reliability - Volume 85, June 2018, Pages 71-83
نویسندگان
Jian-Xun Zhang, Xiao-Sheng Si, Dang-Bo Du, Chang-Hua Hu,