کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6945794 | 1450519 | 2018 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Technology scaling implications for BTI reliability
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
BTI has long been a concern for transistor reliability, and as such garnered significant attention for process optimization and qualification. Typically, the details of a given technology are reported in the literature at the time of qualification. However, not much attention is paid to the larger trends that emerge generation to generation. In this work, we describe the trends when scaling from the 90â¯nm to 14â¯nm technology nodes, detail the implications of scaling and architecture changes, as well as discuss the challenges associated with modeling BTI as technologies evolve.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 82, March 2018, Pages 42-50
Journal: Microelectronics Reliability - Volume 82, March 2018, Pages 42-50
نویسندگان
S.M. Ramey, C. Prasad, A. Rahman,