Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices

Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 55, Issues 9–10, August–September 2015, Pages 1697-1702

K. Adokanou, K. Inal, P. Montmitonnet, F. Pressecq, B. Bonnet, J.-L. Muraro,