کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
700997 890968 2009 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
An attempt to identify the presence of polytype stacking faults in hBN powders by means of X-ray diffraction
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
An attempt to identify the presence of polytype stacking faults in hBN powders by means of X-ray diffraction
چکیده انگلیسی

X-ray diffraction techniques have been used to characterize the three-dimensional order and the crystallite size for 17 hBN powders intended to be used as precursors in the cBN synthesis. Six hBN powders (group A) were obtained by the amidic method (borax + urea) purposely for this research and the remaining 11 hBN powders (group B) were commercial products of recognized companies. Attempts have been made to establish linear correlations between the X-ray revealed parameters of the hBN powders. An explanation sustained on experimental basis is proposed for the different linear correlation between the graphitizing index G.I. and order parameter p3 in the two groups, that points to the existence of polytype stacking faults in hBN depending on the way of fabrication.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 18, Issue 9, September 2009, Pages 1157–1162
نویسندگان
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