کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
701492 1460763 2016 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electrochemical degradation of chlorobenzene on conductive-diamond electrode
ترجمه فارسی عنوان
تخریب الکتروشیمیایی کلربرنزن بر روی الکترود الکتریکی هدایت الکتریکی
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
چکیده انگلیسی


• There is a new conductive-diamond powder which possesses high conductivity.
• An efficient conductive-diamond electrode was successfully fabricated.
• The electrochemical degradation of chlorobenzene (CB) was investigated on it.

Conductive-diamond powder was co-deposited with nickel to form Ni-conductive-diamond composite electrode. Conductive-diamond electrode, which can be used for stable anode, was successfully fabricated by Ni-conductive-diamond composite electrode dip coating with polyvinylidene fluoride (PVDF) and reveal the conductive-diamond by polishing the PVDF coated on the conductive-diamond powder surface. The conductive-diamond electrode possesses extremely wide potential window, extending almost 2 V in acid, 2.5 V in alkali and 1.75V in salt solution. The electrochemical degradation of chlorobenzene (CB) with the prepared conductive-diamond electrode and Pt electrode was evaluated with the parameter of total organic carbon (TOC) removal, the TOC removal efficiency reached 92.6% on the conductive-diamond electrode, much higher than 82.5% on Pt electrode under the same experiment condition.Prime novelty statement(1)Conductive-diamond powder was co-deposited with nickel to form composite electrode.(2)The electrochemical degradation of chlorobenzene with the prepared conductive-diamond electrode and Pt electrode was evaluated. With the parameter of total organic carbon (TOC) removal, the TOC removal reached 92.6% on the conductive-diamond electrode, much higher than 82.5% on Pt electrode under the same experiment condition.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 68, September 2016, Pages 71–77
نویسندگان
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