کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7116800 | 1461210 | 2017 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Analysis of 3D NAND technologies and comparison between charge-trap-based and floating-gate-based flash devices
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موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
NAND flash chips have been innovated from two-dimension (2D) design which is based on planar NAND cells to three-dimension (3D) design which is based on vertical NAND cells. Two types of NAND flash technologies-charge-trap (CT) and floating-gate (FG) are presented in this paper to introduce NAND flash designs in detail. The physical characteristics of CT-based and FG-based 3D NAND flashes are analyzed. Moreover, the advantages and disadvantages of these two technologies in architecture, manufacture, interference and reliability are studied and compared.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: The Journal of China Universities of Posts and Telecommunications - Volume 24, Issue 3, June 2017, Pages 75-96
Journal: The Journal of China Universities of Posts and Telecommunications - Volume 24, Issue 3, June 2017, Pages 75-96
نویسندگان
Liu Shijun, Zou Xuecheng,