Keywords: تله شارژ; Resistive switching; Multilevel memory; Carbon nanotubes; Rewritable; Charge trap;
مقالات ISI تله شارژ (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: تله شارژ; Organic semiconductor; Charge trap; Activation energy;
Keywords: تله شارژ; Carbon nanotube; Random telegraph noise; Quantum dot; Charge trap
Keywords: تله شارژ; Split-gate; Charge trap; Flash; Memory window; Programming window; Ultra-scaling;
Keywords: تله شارژ; Memory device; Write-once-read-many-times; Planarity; Spacial distortion; Charge trap; Benzoquinoline
Keywords: تله شارژ; Negative differential resistance; Organic thin film transistor; Organic small molecule; Photo-responsive; Charge trap;
Hole trapping characteristics of silicon carbonitride (SiCN)-based charge trapping memories evaluated by the constant-current carrier injection method
Keywords: تله شارژ; SiCN; Nonvolatile semiconductor memory; Hole trapping characteristics; Charge trap; Charge centroid;
Analysis of 3D NAND technologies and comparison between charge-trap-based and floating-gate-based flash devices
Keywords: تله شارژ; 3D NAND flash; charge trap; floating gate;
The effect of annealing atmosphere on the (HfO2)0.9(Al2O3)0.1 based charge trapping nonvolatile memory
Keywords: تله شارژ; Charge trap; Annealing atmosphere; Memory devices; Atomic layer deposition; Thin films;
Non-volatile organic memory effect with thickness control of the insulating LiF charge trap layer
Keywords: تله شارژ; Organic electronics; Organic bistability; Charge trap; Electron transport; Non-volatile memory
Memory characteristics of multi-stacked thin films using La2O3 and LaAlO3 as charge trap layer
Keywords: تله شارژ; Flash; ONO; Charge trap; High-k dielectrics; La2O3; LaAlO3;
Electrical properties and structure of laser-spike-annealed hafnium oxide
Keywords: تله شارژ; Hafnium oxide; Laser-spike annealing; Charge trap; Defects; High-k dielectrics; X-ray photoelectron spectroscopy; Transmission electron spectroscopy
Formation of Pentacene wetting layer on the SiO2 surface and charge trap in the wetting layer
Keywords: تله شارژ; 68.37.−d; 68.55.−a; 73.61.Ph; 78.20.BhPentacene; Scanning capacitance microscopy; Spectroscopic ellipsometry; Charge trap
Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy
Keywords: تله شارژ; 85.35.Kt; 87.64.Dz; 84.37.+q; 68.47.GhSGM; CNFET; CNT; Charge trap; Defect; Silicon oxide
Wear-out of Al-Ta2O5/SiO2-Si structures under dynamic stress
Keywords: تله شارژ; ac stress; High-k dielectric; Charge trap; Metal gate;
A method for correlating charge traps of polypropylene to its morphology
Keywords: تله شارژ; Charge trap; Polypropylene; Morphology; TSC;
A new charge-trapping nonvolatile memory based on the re-oxidized nitrous oxide
Keywords: تله شارژ; Re-oxidized N2O; Nitrogen-rich layer; Charge trap; Nonvolatile memory; Gate oxide reliability;