کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7150921 1462217 2016 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Impact of gate dielectric constant variation on tunnel field-effect transistors (TFETs)
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Impact of gate dielectric constant variation on tunnel field-effect transistors (TFETs)
چکیده انگلیسی
The influence of gate dielectric constant variation on tunnel field-effect transistors (TFETs) has been investigated. High-κ materials in polycrystalline nature induce localized gate dielectric constant variation. According to the simulation results, TFETs show larger standard deviation of threshold voltage (Vth), subthreshold swing (SS) and saturation current (Id,sat) than metal-oxide-semiconductor FETs (MOSFETs). It has been revealed that local gate dielectric constant variation should be considered to evaluate the total variation of TFETs. This is because the gate insulator near the source region dominates TFET performance. Also, the ideas have been proposed in order to reduce the gate dielectric constant variation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid-State Electronics - Volume 116, February 2016, Pages 88-94
نویسندگان
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