کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
731468 | 893065 | 2012 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Resistance measurement of isolated single-walled carbon nanotubes
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Resistance measurement of isolated single-walled carbon nanotubes Resistance measurement of isolated single-walled carbon nanotubes](/preview/png/731468.png)
چکیده انگلیسی
Conductive atomic force microscopy (CAFM) and Kelvin force microscopy (KFM) were used to measure the resistance of isolated single-walled carbon nanotubes (SWNTs). By analyzing the current map and surface potential obtained from CAFM and KFM methods respectively, the intrinsic resistance of SWNTs could be calculated. The results calculated by these two methods are the same for the same batch of SWNTs, which is on the order of 107–108 Ω.
► The resistance of isolated single-walled carbon nanotubes was measured.
► Conductive atomic force microscopy and Kelvin force microscopy were used.
► The resistances are the same for the same batch of nanotubes by the two methods.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 45, Issue 5, June 2012, Pages 1297–1300
Journal: Measurement - Volume 45, Issue 5, June 2012, Pages 1297–1300
نویسندگان
Bo Zhao, Hongxia Qi, Dong Xu,