Keywords: میکروسکوپ نیروی اتمی; Chloride flux; Brazing; Aluminum alloy; Conductive atomic force microscopy; Oxide-film removal;
مقالات ISI میکروسکوپ نیروی اتمی (ترجمه نشده)
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Keywords: میکروسکوپ نیروی اتمی; High-temperature polymer electrolyte membrane fuel cell; Polytetrafluoroethylene content; Conductive atomic force microscopy; Membrane electrode assembly; Break-in behavior; Triton X-100
Keywords: میکروسکوپ نیروی اتمی; Radial junction solar cells; Silicon nanowires; Thin films; Structural disorder; Conductive atomic force microscopy; Nanoindentation; Correlative microscopy;
Keywords: میکروسکوپ نیروی اتمی; Bulk metallic glass; Native oxidation process; Electrical conductivity; Structure of the native surface oxide; Transmission electron microscopy; Conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Irradiation; Tungsten
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Irradiation; He bubbles
Keywords: میکروسکوپ نیروی اتمی; Metalloporphyrin; Thin film; Transport properties; Conductive atomic force microscopy;
Keywords: میکروسکوپ نیروی اتمی; Organic photovoltaic devices; Poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate); Indium tin oxide-free; Conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Nanoscale current imaging; Poly(3-hexylthiophene);
Revealing multimode resistive switching in Cu-O nanostructures using conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Nanoscale; Resistive switching; Multimode;
Grain-boundary effect and post treatment of active layer for efficient inverted planar perovskite solar cells
Keywords: میکروسکوپ نیروی اتمی; Planar perovskite solar cell; Grain boundary; Conductive atomic force microscopy; Post treatment;
Resistive switching behavior in copper doped zinc oxide (ZnO:Cu) thin films studied by using scanning probe microscopy techniques
Keywords: میکروسکوپ نیروی اتمی; Resistive switching; Polarization switching; conductive Atomic Force Microscopy; Piezoresponse Force Microscopy; ZnO:Cu thin film;
Effect of Cu/(In+Ga) ratios on the secondary phases and the performance of Cu2InGa(S,Se)4 thin film solar cells
Keywords: میکروسکوپ نیروی اتمی; Cu(In,Ga)Se2 solar cell; Secondary phase; Conductive atomic force microscopy; Leakage current;
The influence of silver and copper ions on the antibacterial activity and local electrical properties of single sepiolite fiber: A conductive atomic force microscopy (C-AFM) study
Keywords: میکروسکوپ نیروی اتمی; Sepiolite; Antibacterial; Conductive fiber; AFM; Conductive atomic force microscopy;
Nano-Newton force based pseudoferroelectric Al-doped ZnO/Si switchable diode
Keywords: میکروسکوپ نیروی اتمی; 81.15.Cd; 73.61.Wp; 73.50.Pz; 68.37.Ps; Kelvin probe force microscopy; Conductive atomic force microscopy; Transparent conductive oxide;
Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; MoS2; Schottky barrier; Ideality factor;
High resolution characterization of grain boundaries in Cu2ZnSnSe4 solar cells synthesized by nanoparticle selenization
Keywords: میکروسکوپ نیروی اتمی; CZTSe; Transmission electron microscopy; Grain boundary; Raman mapping; Photo-current mapping; Conductive atomic force microscopy;
Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures
Keywords: میکروسکوپ نیروی اتمی; Zinc oxide; Conductive atomic force microscopy; Focused ion beam; Nanostructure; Ohmic contact;
Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Resistance switching memory; Radiation hardness; Conductive atomic force microscopy; Hafnium dioxide; Gamma-ray; Oxygen vacancy
Macroscopic and microscopic electrical properties of Cu(In,Ga)Se2 thin-film solar cells with various Ga/(In + Ga) contents
Keywords: میکروسکوپ نیروی اتمی; Cu(In,Ga)Se2; Ga/(In + Ga); Grain boundaries; Conductive atomic force microscopy
Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Graphene; SiC; Electronic transport; Conductive atomic force microscopy;
Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; ZnO nanorods; Conductive atomic force microscopy; Schottky barrier height;
Bimodal CAFM TDDB distributions in polycrystalline HfO2 gate stacks: The role of the interfacial layer and grain boundaries
Keywords: میکروسکوپ نیروی اتمی; Dielectric breakdown; Conductive atomic force microscopy; High-k; Grain boundaries; Bimodal Weibull distributions;
The unexpected effects of crystallization on Ta2O5 as studied by HRTEM and C-AFM
Keywords: میکروسکوپ نیروی اتمی; C-AFM; Conductive atomic force microscopy; High-k; Ta2O5;
Pre- and post-breakdown electrical studies in ultrathin Al2O3 films by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Al2O3; Electrical characterization; Atomic layer deposition; Dielectric breakdown; Reliability
Structure and Electrical Characteristics of Zinc Oxide Thin Films Grown on Si (111) by Metal-organic Chemical Vapor Deposition
Keywords: میکروسکوپ نیروی اتمی; ZnO thin films; Metal-organic chemical vapor deposition; Conductive atomic force microscopy; Scanning electron microscopy;
Structural and electrical evolution of He ion irradiated hydrocarbon films observed by conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Hydrocarbon films; Ion irradiation;
Resistance measurement of isolated single-walled carbon nanotubes
Keywords: میکروسکوپ نیروی اتمی; Carbon nanotubes; Conductive atomic force microscopy; Kelvin force microscopy
Investigation of local electronic transport and surface potential distribution of Cu(In,Ga)Se2 thin-films
Keywords: میکروسکوپ نیروی اتمی; Cu(In,Ga)Se2; Conductive atomic force microscopy; Kelvin probe force microscopy; Grain boundaries
X-ray photoelectron spectroscopy and conducting atomic force microscopy investigations on dual ion beam sputtered MgO ultrathin films
Keywords: میکروسکوپ نیروی اتمی; Magnesium oxide; Thin films; Dual ion beam sputtering; X-ray photoelectron spectroscopy; Conductive atomic force microscopy
Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Poly(3,4-ethylenedioxypyrrole); Conductive atomic force microscopy; Kelvin probe force microscopy; Multiwalled carbon nanotubes
Surface properties of silicon oxide films deposited using low-pressure dielectric barrier discharge
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; SiO2 films; XPS;
Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks: A conducting AFM study
Keywords: میکروسکوپ نیروی اتمی; High-k dielectrics; Conductive atomic force microscopy; Silicon; Germanium; CMOS
Structure and electrical properties of tungsten oxide nanorods epitaxially organized on a mica substrate
Keywords: میکروسکوپ نیروی اتمی; Nanorods; Tungsten oxide; Conductive atomic force microscopy; Conductivity; Epitaxial growth;
Probing individual nanoscale organic light-emitting diodes with atomic force electroluminescence microscopy and bridge-enhanced nanoscale impedance microscopy
Keywords: میکروسکوپ نیروی اتمی; 81.07.Pr; 72.80.Le; 42.70.JkOLEDs; Conductive atomic force microscopy; Impedance spectroscopy; Sub-micron; Interface traps; Spatial variations
Electrical properties of CdTe/CdS solar cells investigated with conductive atomic force microscopy
Keywords: میکروسکوپ نیروی اتمی; Conductive atomic force microscopy; Cadmium telluride; Solar cells
Vertical electron transport study in GaN/AlN/GaN heterostructures
Keywords: میکروسکوپ نیروی اتمی; GaN; Resonant tunneling diode; Two dimensional electron gas; Conductive atomic force microscopy
Nanoscale materials patterning and engineering by atomic force microscopy nanolithography
Keywords: میکروسکوپ نیروی اتمی; AFM; atomic force microscopy; cAFM; conductive atomic force microscopy; CNT; carbon nanotube; 2DEG; two-dimensional electron gas; DPN; dip-pen nanolithography; EDPN; electrochemical dip-pen nanolithography; F-N; Fowler-Nordheim; HMDS; hexamethyldisila
Electrostriction in single-walled carbon nanotubes
Keywords: میکروسکوپ نیروی اتمی; Carbon nanotube; Conductive atomic force microscopy; Electrostriction strain;
Conductive atomic force microscopy study of plastocyanin molecules adsorbed on gold electrode
Keywords: میکروسکوپ نیروی اتمی; Metalloprotein; Conduction; Plastocyanin; Conductive atomic force microscopy;