Resistive switching behavior in copper doped zinc oxide (ZnO:Cu) thin films studied by using scanning probe microscopy techniques

Resistive switching behavior in copper doped zinc oxide (ZnO:Cu) thin films studied by using scanning probe microscopy techniques

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 709, 30 June 2017, Pages 535-541

Juanxiu Xiao, Tun Seng Herng, Jun Ding, Kaiyang Zeng,