کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
748112 1462260 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Reduction of the trap density at the organic–organic interface and resultant gate-bias dependency of the mobility in an organic thin-film transistor
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Reduction of the trap density at the organic–organic interface and resultant gate-bias dependency of the mobility in an organic thin-film transistor
چکیده انگلیسی

We investigate the effect of the thermal treatment on the reduction of the trap density (Nit) at the organic–organic interface together with the mobility dependency to the gate-bias in an organic thin-film transistor (OTFT). The Nit between a poly(4-vinylphenol) layer and a pentacene film is found to be reduced due to the rearranged pentacene molecules during thermal treatment and the resultant mobility is obtained as high as 1.78 cm2/V s. In addition, the mobility dependency to the gate-bias is decreased at the case of thermally-treated OTFT. It can be concluded that the Nit plays an important role on the electrical performances as well as the bias-stability.

Figure optionsDownload as PowerPoint slideHighlights
► Effect of the thermal treatment on the reduction of the trap density was studied.
► Gate-bias dependency of the mobility was examined in a viewpoint of the trap density.
► High mobility of 1.78 cm2/V s was obtained in thermally treated transistor.
► Role of the interfacial trap density for bias-stability and performance were described.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid-State Electronics - Volume 72, June 2012, Pages 44–47
نویسندگان
, ,