Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation

A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.

► Phase noise of oscillator is simulated with physics-based device simulation.
► The simulation reflects the statistical effect of random dopant fluctuation.
► Simulation result is compared with measured phase noise of RFCMOS LC oscillator.
► Relative contribution from various phase noise sources is identified and compared.
► Spatial distribution of phase noise source inside the device is identified.