کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
753249 895505 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Estimation of amorphous fraction in multilevel phase-change memory cells
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Estimation of amorphous fraction in multilevel phase-change memory cells
چکیده انگلیسی

The effective thickness of the amorphous chalcogenide part within the active element of a phase-change memory cell is estimated through electrical measurements. Current–voltage characteristics obtained at various intermediate cell states are fitted with the trap-limited subthreshold transport model of [9] and the amorphous part thickness is then extracted. Several cell electrical measures, such as the resistance and the threshold voltage, are shown to closely relate to the estimated parameter. The results serve to further validate the trap-limited conduction model, as well as the series phase distribution hypothesis in the active layer of a phase-change memory cell.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid-State Electronics - Volume 54, Issue 9, September 2010, Pages 991–996
نویسندگان
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