Double-gate pentacene thin-film transistor with improved control in sub-threshold region

In this work double-gate pentacene TFT architecture is proposed and experimentally investigated. The devices are fabricated on a polyimide substrate based on a process that combines three levels of stencil lithography with standard photolithography. Similarly to the operation of a conventional double-gate silicon FET, the top-gate bias modulates the threshold voltage of the bottom-gate transistor and significantly improves the transistor sub-threshold swing and leakage current. Moreover, the double gate TFT shows good promise for the enhancement of ION/IOFF, especially by the control of IOFF in devices with poor top interfaces.