Characterization of Ni-cermet degradation phenomena I. Long term resistivity monitoring, image processing and X-ray fluorescence analysis

Characterization of Ni-cermet degradation phenomena I. Long term resistivity monitoring, image processing and X-ray fluorescence analysis

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Power Sources - Volume 286, 15 July 2015, Pages 414-426

M.V. Ananyev, D.I. Bronin, D.A. Osinkin, V.A. Eremin, R. Steinberger-Wilckens, L.G.J. de Haart, J. Mertens,