La0.8Sr0.2Ga0.8Mg0.2O3 − δ thin films for IT-SOFCs: Microstructure and transport properties correlation

► Deposition of La0.8Sr0.2Ga0.8Mg0.2O3 on (001) NdGaO3 and SrTiO3 buffered (001) MgO substrates. ► Structural and microstructural analysis of the films. ► Transport properties analysis. ► Correlation between the film thickness, the grain boundary concentration, and the conductivity.