کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7870738 | 1509190 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Optical and structural studies of silicon-enriched films obtained by dc-magnetron co-sputtering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
بیومتریال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Optical and structural studies of silicon-enriched films obtained by dc-magnetron co-sputtering Optical and structural studies of silicon-enriched films obtained by dc-magnetron co-sputtering](/preview/png/7870738.png)
چکیده انگلیسی
We present in this work preliminary studies concerning the optical characterization, by optical absorption, photoluminescence and Raman spectroscopies, of Si-enriched films into a SiO2 matrix as a function of the Si concentration. The Si-molar concentration dependence shows different characteristics for each one of the samples: low Si concentration samples (lower than 50Â mol% of silicon) showed, at room temperature, a low energy PL band around 1.6Â eV, whereas samples with higher concentration (>Â 50Â mol% of silicon) showed a PL band at 2.27Â eV. Raman spectra of the samples account for different characteristics: low Si concentration samples showed a contribution of the amorphous phase of SiO2, whereas for high Si concentration samples, a relaxation of the selection rules is observed. Discussion and analysis of the experimental results are presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: C - Volume 27, Issues 5â8, September 2007, Pages 1074-1077
Journal: Materials Science and Engineering: C - Volume 27, Issues 5â8, September 2007, Pages 1074-1077
نویسندگان
J.R. Aguilar-Hernández, G. Monroy-RodrÃguez, M. Cárdenas-GarcÃa, G.S. Contreras-Puente,