Parallel investigation of double forged pure tungsten samples irradiated in three DPF devices

The double forged pure tungsten (W) samples (supplied by IAEA CRP from the FZJ team in Juelich, Germany) were irradiated in DPF (dense plasma focus) devices PF-12, “Bora” and PF-1000 by hot plasma and fast ion streams. We have used the following analytical methods: microscopy (optical and scanning electron), X-ray photoelectron spectroscopy, electrical conductivity and microroughness measurements. The damage dependence of the tungsten grades on irradiation conditions and power flux densities of irradiation processes is discussed.