کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7966433 1514186 2015 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Process optimization for diffusion bonding of tungsten with EUROFER97 using a vanadium interlayer
موضوعات مرتبط
مهندسی و علوم پایه مهندسی انرژی انرژی هسته ای و مهندسی
پیش نمایش صفحه اول مقاله
Process optimization for diffusion bonding of tungsten with EUROFER97 using a vanadium interlayer
چکیده انگلیسی
For optimal bonding results, the thickness of this layer and the residual stresses has to be decreased sufficiently without a significant reduction of material transport especially at the vanadium/tungsten interface, which can be achieved by varying the diffusion bonding temperature and duration. The investigation results show that at a sufficiently low bonding temperature of 700 °C and a bonding duration of 4 h, the joint reaches a reasonable high ductility and toughness especially at elevated test temperature of 550 °C with elongation to fracture of 20% and mean absorbed Charpy impact energy of 2 J (using miniaturized Charpy impact specimens). The strength of the bonded materials is about 332 MPa at RT and 291 MPa at 550 °C. Furthermore, a low bonding temperature of 700 °C can also help to avoid the grain coarsening and the alteration of the grain structure especially of the EUROFER97 close to the bond interface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Nuclear Materials - Volume 459, April 2015, Pages 217-224
نویسندگان
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